Fully integrated, fully automated generation of short tandem repeat profiles

Overview of attention for article published in Investigative Genetics, August 2013

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In the top 5% of all research outputs scored by Altmetric
High Attention Score compared to outputs of the same age (97th percentile)

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patent: 1 patent

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Application WO-2019014455-A2

World Intellectual Property Organisation (WIPO)

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