Visualizing histopathologic deep learning classification and anomaly detection using nonlinear feature space dimensionality reduction

Overview of attention for article published in BMC Bioinformatics, May 2018

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In the top 25% of all research outputs scored by Altmetric
High Attention Score compared to outputs of the same age (86th percentile)
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twitter: 9 X users

patent: 4 patents

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So far, Altmetric has seen 4 patents that reference this research output.

SYSTEMS AND METHODS TO PROCESS ELECTRONIC IMAGES TO IDENTIFY ABNORMAL MORPHOLOGIES

Application WO-2023114577-A1

World Intellectual Property Organisation (WIPO)

DIAGNOSTIC SUPPORT SYSTEM AND DIAGNOSTIC SUPPORT METHOD

Application EP-3832663-A4

European Patent Office

Diagnosis support system and diagnosis support method

Application CN-112514000-A

China

Method and device for screening abnormal samples of digital pathological images, computer…

Application CN-112233060-A

China

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