Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize

Overview of attention for article published in BMC Plant Biology, August 2015

Altmetric Badge

About this Attention Score

In the top 25% of all research outputs scored by Altmetric
Good Attention Score compared to outputs of the same age (78th percentile)
High Attention Score compared to outputs of the same age and source (87th percentile)

So far, Altmetric has seen 3 X posts from 2 X users, with an upper bound of 7,094 followers.

Genome-wide association mapping reveals novel sources of resistance to northern corn leaf… https://t.co/0B0vu9R1jf https://t.co/0rr9LZtggn

Genome-wide association mapping reveals novel sources of resistance to northern corn leaf… http://t.co/E99TXLWl5o http://t.co/ZzwQvPswpg

Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize. http://t.co/Apttw2tle5

This page shows the most recent X posts that mention this research output.

Click here to find out how to access more activity.