Correlation between the secondary structure of pre-mRNA introns and the efficiency of splicing in Saccharomyces cerevisiae

Overview of attention for article published in BMC Genomics, July 2008

Altmetric Badge

Mentioned by

patent: 1 patent

Readers on

mendeley: 63 Mendeley
connotea: 1 Connotea

Summary Patents

So far, Altmetric has seen 1 patent that references this research output.

INTRAGENIC ASSESSMENT AND METHODS THEREFOR

Application WO-2020181333-A1

World Intellectual Property Organisation (WIPO)

This page shows the most recent patents that mention this research output.

Click here to find out how to access more activity.