Genome-wide association study reveals new loci for yield-related traits in Sichuan wheat germplasm under stripe rust stress

Overview of attention for article published in BMC Genomics, August 2019

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RT @wheatgen_papers: Genome-wide association study reveals new loci for yield-related traits in Sichuan wheat germplasm under stripe rust s…

Genome-wide association study reveals new loci for yield-related traits in Sichuan wheat germplasm under stripe rust stress. https://t.co/KyAMVtUNNx

Genome-wide association study reveals new loci for yield-related traits in Sichuan wheat germplasm under stripe rust stress. https://t.co/RmpPkVtcHi

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